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Physics / Transmission electron microscopy / Scanning transmission electron microscopy / Annular dark-field imaging / Electron microscope / Electron tomography / Defocus aberration / Dark field microscopy / Scanning electron microscope / Electron microscopy / Scientific method / Science


doi:[removed]j.ssc[removed]
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Document Date: 2006-12-07 06:06:04

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File Size: 2,23 MB

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City

Heidelberg / New York / Wiley / /

Company

Argonne National Laboratory / CEOS GmbH / Lawrence Berkeley National Laboratory / Plenum Press / Elsevier Ltd. / Philips / /

Country

Japan / United States / /

Currency

GBP / /

/

Facility

National Center / Osaka University / /

IndustryTerm

dark field imaging / imaging / ion beam technology / chemical differences / /

Organization

African Union / Materials Science Division / office of Basic Energy Sciences / office of Science / Osaka University / /

Person

R. Erni / H. Rose / E. Van Dyck Abstract Annular / M. Haiderc / V / C. Nelson / A.P. Alivisatos / L. Manna / /

/

Position

Director / Corresponding author / D.J. / /

ProvinceOrState

Illinois / New York / California / /

PublishedMedium

Solid State Communications / /

Technology

radiation / ion beam technology / tomography / Simulation / /

URL

www.elsevier.com/locate/ssc / /

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