Compact Modeling Modeling FET Variation within a chip as a Function of Circuit Design and Layout Choices Josef Watts, Ning Lu, Calvin Bittner, Steven Grundon, Jeffrey Oppold

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Date: 2005-05-23 13:16:04 Compact Software Computing Electronic engineering Technology Field-effect transistor IBM		Compact Modeling Modeling FET Variation within a chip as a Function of Circuit Design and Layout Choices Josef Watts, Ning Lu, Calvin Bittner, Steven Grundon, Jeffrey Oppold Add to Reading List Source URL: www.nsti.org Download Document from Source Website File Size: 910,97 KB Share Document on Facebook

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