Compact Modeling Modeling FET Variation within a chip as a Function of Circuit Design and Layout Choices Josef Watts, Ning Lu, Calvin Bittner, Steven Grundon, Jeffrey Oppold - Electronic effect - Document - PDFSEARCH.IO

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	Compact Modeling Modeling FET Variation within a chip as a Function of Circuit Design and Layout Choices Josef Watts, Ning Lu, Calvin Bittner, Steven Grundon, Jeffrey Oppold Add to Reading List Document Date: 2005-05-23 13:16:04 Open Document File Size: 910,97 KB Share Result on Facebook Company IBM Corporation / / IndustryTerm scribe line device / / Person Ion Implant / Steven Grundon / Jeffrey Oppold / Joe Watts / Calvin Bittner / / ProvinceOrState Vermont / / Technology lithography / / SocialTag Compact Software Computing Electronic engineering Technology Field-effect transistor IBM

Compact Modeling Modeling FET Variation within a chip as a Function of Circuit Design and Layout Choices Josef Watts, Ning Lu, Calvin Bittner, Steven Grundon, Jeffrey OppoldAdd to Reading List