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Ellipsometry
Results: 88

#	Item
21	Plasma polymerised thin films for flexible electronic applications Add to Reading List Source URL: www.ntmdt.com Language: English - Date: 2013-08-02 05:35:59 Plasma processing Coating Corrosion Materials science Printing Plasma polymerization Ellipsometry Poly Solar cell Chemistry Optical materials Optics
22	No. 210, February 2010 ISBN[removed]RRP $2.95 Published by the Australian Association of Timetable Collectors www.aattc.org.au These photos (omitted from the website version) are of one of the best situated bus termini Add to Reading List Source URL: www.austta.org.au Language: English - Date: 2010-03-29 23:26:21 Technology Optical filters Anti-reflective coating Ellipsometry Microsoft Excel Filter Thin film Light-emitting diode Optics Thin-film optics Physics
23	FILM STAR Optical Thin Film Software Introduction FilmStar includes programs for designing, measuring and monitoring optical thin film coatings: DESIGN & INDEX, MEASURE, MONITOR and CRYSTAL. tm Add to Reading List Source URL: ftgsoftware.com Language: English - Date: 2013-04-29 16:42:07 Technology Optical filters Anti-reflective coating Ellipsometry Microsoft Excel Filter Thin film Light-emitting diode Optics Thin-film optics Physics
24 $Spectroscopy / Ellipsometry / Radiometry / Physical quantities / Refractive index / Optics / Indium nitride / Chemistry / Physics / Measurement$	doi:[removed]j.tsf[removed] Add to Reading List Source URL: www.ub.edu Language: English - Date: 2008-06-18 13:28:47 Spectroscopy Ellipsometry Radiometry Physical quantities Refractive index Optics Indium nitride Chemistry Physics Measurement
25 $Spectroscopy / Optical mineralogy / Ellipsometry / Radiometry / Refractive index / Birefringence / Chemical imaging / Transfer-matrix method / Physics / Optics / Measurement$	FilmTek ™ Spectrophotometry-Based Metrology Systems 10 to 100 Times Better Resolution FilmTek™ spectrophotometry-based metrology systems from Scientific Computing International (SCI) have long set the Add to Reading List Source URL: www.sci-soft.com Language: English - Date: 2008-10-22 17:47:12 Spectroscopy Optical mineralogy Ellipsometry Radiometry Refractive index Birefringence Chemical imaging Transfer-matrix method Physics Optics Measurement
26	FilmTek Product Brochure.pub Add to Reading List Source URL: www.sci-soft.com Language: English - Date: 2008-10-22 18:17:02 Ellipsometry Radiometry Spectroscopy Photoresist Metrology Silicon on insulator Polarimetry Thin film Materials science Chemistry Optics
27 $Ellipsometry / Radiometry / Spectroscopy / Refractive index / Metrology / Measurement / Optics / Physics$	FilmTek Product Brochure.pub Add to Reading List Source URL: www.sci-soft.com Language: English - Date: 2008-10-22 18:29:26 Ellipsometry Radiometry Spectroscopy Refractive index Metrology Measurement Optics Physics
28	Solid-State Electronics[removed]±709 A general-purpose software for optical characterization of thin ®lms: speci®c features for microelectronic applications S. Bosch , J. Ferre-Borrull, J. Sancho-Parramon Depa Add to Reading List Source URL: www.ub.edu Language: English* - Date: 2004-07-20 06:13:30 Amorphous solid Physics Atmosphere of Earth Measurement Optics Spectroscopy Ellipsometry Radiometry
29 $Physics / Ellipsometry / Radiometry / Spectroscopy / Optical coating / Extinction / Anti-reflective coating / Refractive index / Optics / Thin-film optics / Measurement$	FilmTek Product Brochure.pub Add to Reading List Source URL: www.sci-soft.com Language: English - Date: 2008-10-22 18:16:54 Physics Ellipsometry Radiometry Spectroscopy Optical coating Extinction Anti-reflective coating Refractive index Optics Thin-film optics Measurement
30	doi:[removed]j.apsusc[removed] Add to Reading List Source URL: www.ub.edu Language: English - Date: 2008-06-18 13:28:47 Radiation Ellipsometry Absorption band Infrared Fourier transform infrared spectroscopy Parameter Spectroscopy Electromagnetic radiation Physics

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