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Ellipsometry
Results: 88

#	Item
51 $Metamaterials / Electricity / Optics / Refractive index / Permittivity / Ellipsometry / Kerr effect / Dielectric / Atmospheric duct / Physics / Electromagnetism / Physical quantities$	pubs.acs.org/NanoLett Unity-Order Index Change in Transparent Conducting Oxides at Visible Frequencies Eyal Feigenbaum,,† Kenneth Diest,†,§ and Harry A. Atwater Thomas J. Watson Laboratory of Applied Physics, Cali Add to Reading List Source URL: daedalus.caltech.edu Language: English* - Date: 2010-08-26 13:10:37 Metamaterials Electricity Optics Refractive index Permittivity Ellipsometry Kerr effect Dielectric Atmospheric duct Physics Electromagnetism Physical quantities
52	Continued Investigations in Carbon-Based Thin Films for Fuel Cells and Batteries Add to Reading List Source URL: www.ncnr.nist.gov Language: English - Date: 2014-01-28 15:22:13 Physics Physical optics Materials science Photoresist Polymers Ellipsometry Spin coating Nafion Wafer Chemistry Optics Semiconductor device fabrication
53	Labnote - Reflectometry Measurements on a STADI MP Add to Reading List Source URL: www.stoe.com Language: English - Date: 2014-06-02 11:52:20 Ellipsometry Radiometry Spectroscopy Chemistry Polycrystalline silicon Condensed matter physics Matter Thin films Amorphous solids
54	Characterization and In-situ Monitoring of Sub-stoichiometric Adjustable TC Titanium Nitride Growth arXiv:1209.4626v1 [cond-mat.supr-con] 20 Sep[removed]Michael R. Vissers,∗ Jiansong Gao, Jeffrey S. Kline, Martin Sandber Add to Reading List Source URL: www.kiss.caltech.edu Language: English - Date: 2014-05-05 14:02:28 Radiometry Spectroscopy Semiconductor device fabrication Particle detectors Sensors Ellipsometry Sputtering Kinetic inductance detector Kinetic inductance Physics Matter Chemistry
55	In-Situ Process Sensors for Real-Time Microcircuit Manufacturing Control VALUE PROPOSITION CONTACT INFORMATION Add to Reading List Source URL: dtsn.darpa.mil Language: English - Date: 2013-08-08 13:33:08 Radiometry Chemistry Thin films Measurement DARPA Atomic layer deposition Ultraviolet Spectroscopy Electromagnetic radiation Ellipsometry
56 $Spectroscopy / Microscopy / Optical devices / Nanotechnology / Surface plasmon resonance / Confocal microscopy / Ellipsometry / Refractive index / Surface plasmon / Physics / Science / Optics$	OPEN Light: Science & Applications[removed], e187; doi:[removed]lsa[removed] ß 2014 CIOMP. All rights reserved[removed]www.nature.com/lsa Add to Reading List Source URL: www.nature.com Language: English - Date: 2014-07-04 02:18:00 Spectroscopy Microscopy Optical devices Nanotechnology Surface plasmon resonance Confocal microscopy Ellipsometry Refractive index Surface plasmon Physics Science Optics
57	Publications of CMI in the field of Length Add to Reading List Source URL: www.bipm.org Language: English - Date: 2012-08-31 04:15:46 Laboratory techniques Spectroscopy Surface and Interface Analysis Microscopy Nanometrology Laser Ellipsometry Optics Science Chemistry
58	ABSTRACT along the track at which the track crossing occurred. The instrumentation required is a fast digital oscilloscope, a spectrum analyzer, and a harddrive control program with integrated GPIB data acquisition. In a Add to Reading List Source URL: ssrl.slac.stanford.edu Language: English - Date: 2010-06-28 16:02:40 Computer storage media Ellipsometry Radiometry Spectroscopy Profilometer Hard disk drive Stiction Magnetic force microscope Laser Physics Computer hardware Optics
59	2014 APS/CNM/EMC Users Meeting C-‐2 Layer-‐by-‐layer Fabrication of Oriented Porous Thin Films Based on Porphyrin-‐ containing Metal-‐orga Add to Reading List Source URL: usersmeeting2014.conference.anl.gov Language: English - Date: 2014-05-14 15:28:52 Porphyrin Supramolecular chemistry Tetrapyrroles Ellipsometry MOFs for Catalysis Chemistry Macrocycles Photosynthesis
60	I. I. Kravchenko R&D Staff Cleanroom Process Engineer Center for Nanophase Materials Sciences Oak Ridge National Laboratory[removed] Add to Reading List Source URL: cnms.ornl.gov Language: English - Date: 2013-07-18 13:03:17 Microtechnology Nanotechnology Spectroscopy Nanomaterials Thin film Electron beam lithography Ellipsometry Electron Photolithography Physics Materials science Condensed matter physics

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