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Failure of electronic components
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#	Item
1	SI96-11 Surging Ideas TVS Diode Application Note PROTECTION PRODUCTS ESD Threat to Semiconductor Devices Add to Reading List Source URL: www.semtech.com Language: English - Date: 2013-04-03 13:11:08 Electromagnetism Diodes Electrical breakdown Electrical safety Electrostatics Transient-voltage-suppression diode Leakage Semtech Transient Electric arc Failure of electronic components Electrostatic discharge
2	SI96-11 Surging Ideas TVS Diode Application Note PROTECTION PRODUCTS ESD Threat to Semiconductor Devices Add to Reading List Source URL: www.semtech.com Language: English - Date: 2013-04-03 13:11:08 Diodes Electrical breakdown Electrical safety Electrostatics Transient-voltage-suppression diode Leakage Semtech Transient Electric arc Failure of electronic components Electrostatic discharge
3	eFuse Design and Reliability William R. Tonti FIEEE IEEE Director of Future Directions 445 Hoes lane, Piscataway NY[removed]removed] Add to Reading List Source URL: rs.ieee.org Language: English - Date: 2011-07-27 09:23:59 Electrical engineering Electronic design automation Failure Electromigration Fuse Reliability engineering Polycrystalline silicon Electrode Electromagnetism Electrical components Technology
4	Dependability and Reliability Add to Reading List Source URL: www.lsa.ethz.ch Language: English - Date: 2010-09-28 09:36:54 Reliability engineering Statistics Knowledge Bathtub curve Failure rate ETH Zurich Reliability prediction for electronic components Physics of failure Failure Systems engineering Survival analysis
5	AS MECHANICAL COMPONENTS BEGIN TO FAIL, THEY RELEASE METALLIC DEBRIS INTO THEIR LUBRICATING OIL SYSTEMS. Conventional methods of failure detection such as chip detectors or sampled oil analysis are often not able to ide Add to Reading List Source URL: www.gastops.com Language: English - Date: 2010-07-10 12:01:09 Electronics Backwashing Physical oceanography Chemistry Oil filter Lubricant Electronic filter Air filter Filters Technology Water filters
6	PROJECT PROFILE A407: Failure mechanism driven qualification for reliability and analysis of electronic components (FdQ) AUTOMOTIVE ELECTRONICS Add to Reading List Source URL: www.catrene.org Language: English - Date: 2009-03-25 10:36:38 Science Reliability engineering Survival analysis Maintenance Semiconductor device fabrication Reliability Physics of failure Failure rate Failure analysis Failure Systems engineering Knowledge

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