Mode Note Conductive AFM Probing the Local Electronic Structure of a Sample’s Surface Figure 1. Schematic diagram of the XE-series Conductive AFM system

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Date: 2009-12-27 18:00:00 Chemistry Conductive atomic force microscopy Photoconductive atomic force microscopy Scanning probe microscopy Science Scientific method		Mode Note Conductive AFM Probing the Local Electronic Structure of a Sample’s Surface Figure 1. Schematic diagram of the XE-series Conductive AFM system Add to Reading List Source URL: www.nanowerk.com Download Document from Source Website File Size: 311,73 KB Share Document on Facebook