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Mode Note Conductive AFM Probing the Local Electronic Structure of a Sample’s Surface Figure 1. Schematic diagram of the XE-series Conductive AFM system
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Document Date: 2009-12-27 18:00:00
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File Size: 311,73 KB
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IndustryTerm
industrial applications /
/
Organization
African Union /
/
Technology
spectroscopy /
IC chip /
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SocialTag
Chemistry
Conductive atomic force microscopy
Photoconductive atomic force microscopy
Scanning probe microscopy
Science
Scientific method