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![]() Date: 2014-01-31 15:00:57Electron microscope Scanning electron microscope Scanning transmission electron microscopy Environmental scanning electron microscope Transmission electron microscopy Microscope Annular dark-field imaging Gaseous detection device Microscopy Electron microscopy Scientific method Science | Add to Reading List |
![]() | Journal of Undergraduate Research 5, The Dependence of Sample Thickness on Annular Bright Field Microscopy M. M. G. Latting, W. Walkosz, and R. F. Klie Nanoscale Physics Group- Department of Physics UniversityDocID: 1qMR9 - View Document |
![]() | Jeol JEM-2800 Transmission Electron Microscope The JEM-2800 is a high throughput nano-analysis TEM with automated functions Operation Modes: • TEMDocID: 19qAf - View Document |
![]() | Practical module Scanning electron microscopy Goals • • •DocID: 136gc - View Document |
![]() | doi:j.micronDocID: W8bg - View Document |
![]() | doi:[removed]j.ssc[removed]DocID: 3jER - View Document |