SISPAD 2012, September 5-7, 2012, Denver, CO, USA 3D Simulation Study of Work-Function Variability in a 25 nm Metal-Gate FinFET with Curved Geometry using Voronoi Grains G. Indalecio and A.J. Garc´ıa-Loureiro

First Page		Document Content
Date: 2013-02-12 08:39:11		SISPAD 2012, September 5-7, 2012, Denver, CO, USA 3D Simulation Study of Work-Function Variability in a 25 nm Metal-Gate FinFET with Curved Geometry using Voronoi Grains G. Indalecio and A.J. Garc´ıa-Loureiro Add to Reading List Source URL: in4.iue.tuwien.ac.at Download Document from Source Website File Size: 533,04 KB Share Document on Facebook