![](https://www.pdfsearch.io/img/3c5e5b50e44bef7f8aecd9ba91e9546d.jpg) Date: 2013-02-12 08:39:11
| | SISPAD 2012, September 5-7, 2012, Denver, CO, USA 3D Simulation Study of Work-Function Variability in a 25 nm Metal-Gate FinFET with Curved Geometry using Voronoi Grains G. Indalecio and A.J. Garc´ıa-LoureiroAdd to Reading ListSource URL: in4.iue.tuwien.ac.atDownload Document from Source Website File Size: 533,04 KBShare Document on Facebook
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