SISPAD 2012, September 5-7, 2012, Denver, CO, USA 3D Simulation Study of Work-Function Variability in a 25 nm Metal-Gate FinFET with Curved Geometry using Voronoi Grains G. Indalecio and A.J. Garc´ıa-Loureiro - Gate - Document - PDFSEARCH.IO

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	SISPAD 2012, September 5-7, 2012, Denver, CO, USA 3D Simulation Study of Work-Function Variability in a 25 nm Metal-Gate FinFET with Curved Geometry using Voronoi Grains G. Indalecio and A.J. Garc´ıa-Loureiro Add to Reading List Document Date: 2013-02-12 08:39:11 Open Document File Size: 533,04 KB Share Result on Facebook

SISPAD 2012, September 5-7, 2012, Denver, CO, USA 3D Simulation Study of Work-Function Variability in a 25 nm Metal-Gate FinFET with Curved Geometry using Voronoi Grains G. Indalecio and A.J. Garc´ıa-LoureiroAdd to Reading List