![Spectroscopy / Semiconductor device fabrication / Nanomaterials / X-ray photoelectron spectroscopy / Annealing / Electronvolt / Ion implantation / Silicon dioxide / X-ray / Chemistry / Physics / Science Spectroscopy / Semiconductor device fabrication / Nanomaterials / X-ray photoelectron spectroscopy / Annealing / Electronvolt / Ion implantation / Silicon dioxide / X-ray / Chemistry / Physics / Science](https://www.pdfsearch.io/img/45db736479a55b7d4fb3043b1f348270.jpg) Date: 2007-07-14 20:01:59Spectroscopy Semiconductor device fabrication Nanomaterials X-ray photoelectron spectroscopy Annealing Electronvolt Ion implantation Silicon dioxide X-ray Chemistry Physics Science | | Defect-related versus excitonic visible light emission from ion beam synthesized Si nanocrystals in SiO2 K. S. Min,a) K. V. Shcheglov, C. M. Yang, and Harry A. Atwater Thomas J. Watson Laboratory of Applied Physics, CaliAdd to Reading ListSource URL: daedalus.caltech.eduDownload Document from Source Website File Size: 181,65 KBShare Document on Facebook
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