Defect-related versus excitonic visible light emission from ion beam synthesized Si nanocrystals in SiO2 K. S. Min,a) K. V. Shcheglov, C. M. Yang, and Harry A. Atwater Thomas J. Watson Laboratory of Applied Physics, Cali

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Date: 2007-07-14 20:01:59 Spectroscopy Semiconductor device fabrication Nanomaterials X-ray photoelectron spectroscopy Annealing Electronvolt Ion implantation Silicon dioxide X-ray Chemistry Physics Science		Defect-related versus excitonic visible light emission from ion beam synthesized Si nanocrystals in SiO2 K. S. Min,a) K. V. Shcheglov, C. M. Yang, and Harry A. Atwater Thomas J. Watson Laboratory of Applied Physics, Cali Add to Reading List Source URL: daedalus.caltech.edu Download Document from Source Website File Size: 181,65 KB Share Document on Facebook

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