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Spectroscopy / Semiconductor device fabrication / Nanomaterials / X-ray photoelectron spectroscopy / Annealing / Electronvolt / Ion implantation / Silicon dioxide / X-ray / Chemistry / Physics / Science


Defect-related versus excitonic visible light emission from ion beam synthesized Si nanocrystals in SiO2 K. S. Min,a) K. V. Shcheglov, C. M. Yang, and Harry A. Atwater Thomas J. Watson Laboratory of Applied Physics, Cali
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Document Date: 2007-07-14 20:01:59


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City

Pasadena / New York / /

Company

J. D. Budai S. P. / W. Paul S. P. / /

Currency

pence / USD / /

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Event

Product Issues / /

Facility

Harry A. Atwater Thomas J. Watson Laboratory of Applied Physics / California Institute of Technology / American Institute of Physics / A. Polman FOM Institute / /

IndustryTerm

lower binding energy / peak energy shift / peak energy / chemical and mechanical stability / low energy / energy / /

Organization

C. M. Yang / and Harry A. Atwater Thomas J. Watson Laboratory of Applied Physics / California Institute of Technology / American Institute of Physics / M. L. Brongersma and A. Polman FOM Institute for Atomic and Molecular Physics / U.S. Department of Energy / NATO Ministry for Scientific Affairs / /

Person

C. W. White / D. M. Hembree / Jr. / J. G. Zhu / /

Product

SiO2 / matrix / /

ProgrammingLanguage

C / /

ProvinceOrState

New York / California / /

Technology

spectroscopy / radiation / laser / x-ray / recombination / integrated circuit / /

URL

http /

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