Back to Results
First PageMeta Content



Proceedings of the 2010 5th IEEE International Conference on Nano/Micro Engineered and Molecular Systems January 20-23, Xiamen, China Stiction of Parylene C to Silicon Surface Measured using Blister Tests
Add to Reading List

Document Date: 2017-03-21 04:13:56


Open Document

File Size: 1.023,16 KB

Share Result on Facebook
UPDATE