1![Desco Launches Statshield® Foil Moisture Barrier Bag with IPC/JEDEC Moisture Sensitive Caution Markings Desco Launches Statshield® Foil Moisture Barrier Bag with IPC/JEDEC Moisture Sensitive Caution Markings](https://www.pdfsearch.io/img/84cabaf245c3def316c4f4097250846e.jpg) | Add to Reading ListSource URL: www.esdjournal.comLanguage: English - Date: 2014-06-11 12:44:36
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2![Datasheet nanoSSD 3SE series - Compliant with JEDEC MO-276 Specification Datasheet nanoSSD 3SE series - Compliant with JEDEC MO-276 Specification](https://www.pdfsearch.io/img/e72022e007169043630f7d25622d143c.jpg) | Add to Reading ListSource URL: tritech.seLanguage: English - Date: 2015-07-31 10:48:08
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3![Datasheet nanoSSD 3ME series - Compliant with JEDEC MO-276 Specification Datasheet nanoSSD 3ME series - Compliant with JEDEC MO-276 Specification](https://www.pdfsearch.io/img/ad3c3a619c8af06bdbc4961bde7f4fae.jpg) | Add to Reading ListSource URL: tritech.seLanguage: English - Date: 2015-07-31 10:51:33
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4![DRAM • REMOVABLE • EMBEDDED SMART’s Memory Solutions SMART offers a wide lineup of Tier 1 ODM JEDEC-standard DDR4 and DDR3 memory modules. DRAM • REMOVABLE • EMBEDDED SMART’s Memory Solutions SMART offers a wide lineup of Tier 1 ODM JEDEC-standard DDR4 and DDR3 memory modules.](https://www.pdfsearch.io/img/71b9885f3618b930353ef1b40dc574d5.jpg) | Add to Reading ListSource URL: www.smartm.comLanguage: English - Date: 2015-10-15 17:02:32
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5![Datasheet nanoSSD 3IE series - Compliant with JEDEC MO-276 Specification Datasheet nanoSSD 3IE series - Compliant with JEDEC MO-276 Specification](https://www.pdfsearch.io/img/e5c9ffc6f21981f11673e4f09e624905.jpg) | Add to Reading ListSource URL: tritech.seLanguage: English - Date: 2015-07-31 10:44:59
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6![Transistor - Diode Cross Reference - H.P. Part Numbers to JEDEC Numbers Part Num Transistor - Diode Cross Reference - H.P. Part Numbers to JEDEC Numbers Part Num](https://www.pdfsearch.io/img/a90982afa0ce42e124d50e9c6870151e.jpg) | Add to Reading ListSource URL: www.premium-rx.orgLanguage: Vietnamese - Date: 2007-03-28 18:11:55
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7![Visio-JEDEC Memory Bit width Comparison_★.vsd Visio-JEDEC Memory Bit width Comparison_★.vsd](https://www.pdfsearch.io/img/fe303859a33ff4e726e65a296dde1c4e.jpg) | Add to Reading ListSource URL: pc.watch.impress.co.jp- Date: 2015-04-20 23:42:57
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8![DEVELOPMENTS THE EXPANDING ROLE AND IMPORTANCE OF STANDARDS IN THE INFORMATION AND COMMUNICATIONS TECHNOLOGY INDUSTRY DEVELOPMENTS THE EXPANDING ROLE AND IMPORTANCE OF STANDARDS IN THE INFORMATION AND COMMUNICATIONS TECHNOLOGY INDUSTRY](https://www.pdfsearch.io/img/f35e3f7b83c8bdb169440fe6f6171149.jpg) | Add to Reading ListSource URL: standardslaw.orgLanguage: English - Date: 2012-11-12 00:15:49
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9![Tecate Group on Halogen Free Tecate Group capacitors of the below listed types are halogen free. Tecate Group uses the definition excerpted from JEDEC/ECA JS709A, May, 2012, as follows: Page 1, “1 Scope. While the halo Tecate Group on Halogen Free Tecate Group capacitors of the below listed types are halogen free. Tecate Group uses the definition excerpted from JEDEC/ECA JS709A, May, 2012, as follows: Page 1, “1 Scope. While the halo](https://www.pdfsearch.io/img/72f657eccc09843f4d0dad44239680b0.jpg) | Add to Reading ListSource URL: www.tecategroup.comLanguage: English - Date: 2014-12-08 16:47:16
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10![This article is part of the Reliability Society 2010 Annual Technical Report Arcing Enabled by Tin Whiskers Brian D’Andrade, Alex Z. Kattamis, Patrick F. Murphy, John McNulty and Shukri Souri Exponent, Inc. Email: {bd This article is part of the Reliability Society 2010 Annual Technical Report Arcing Enabled by Tin Whiskers Brian D’Andrade, Alex Z. Kattamis, Patrick F. Murphy, John McNulty and Shukri Souri Exponent, Inc. Email: {bd](https://www.pdfsearch.io/img/4f4abdb702c5b08bd4720a46def482db.jpg) | Add to Reading ListSource URL: rs.ieee.orgLanguage: English - Date: 2011-06-09 12:51:57
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