APPLIED PHYSICS LETTERS 86, 033103 共2005兲 Probing the size and density of silicon nanocrystals in nanocrystal memory device applications Tao Feng,a兲 Hongbin Yu, Matthew Dicken, James R. Heath, and Harry A. Atwater - James R. Heath - Document - PDFSEARCH.IO - Document Search Engine

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$Scanning probe microscopy / Diffraction / Emerging technologies / Microscopes / Spectroscopy / Scanning tunneling microscope / Quantum dot / Reflection high-energy electron diffraction / Atomic force microscopy / Science / Scientific method / Chemistry$ Date: 2006-10-31 04:02:21 Scanning probe microscopy Diffraction Emerging technologies Microscopes Spectroscopy Scanning tunneling microscope Quantum dot Reflection high-energy electron diffraction Atomic force microscopy Science Scientific method Chemistry		APPLIED PHYSICS LETTERS 86, 033103 共2005兲 Probing the size and density of silicon nanocrystals in nanocrystal memory device applications Tao Feng,a兲 Hongbin Yu, Matthew Dicken, James R. Heath, and Harry A. Atwater Add to Reading List Source URL: daedalus.caltech.edu Download Document from Source Website File Size: 349,92 KB Share Document on Facebook

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