| Document Date: 2006-04-05 02:15:53
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City AUSTIN / San Jose / / Company Advantest / IBM / LSI Logic / Mentor Graphics / Synopsys / nVIDIA / Philips / Intel / Agilent / / Event Product Issues / / IndustryTerm µm technology / defective chips / vEvery chip / chip manufacturing cost / broken chip / / Organization National Science Foundation / / Person Keynote / Lois T. McCluskey / Phil Nigh / Mike Purtell / Stanford E. Volkerink / Fred Watt / Test Cost / / / Position CTO / CEO / translator / / Product chip / parts Per Million / Access Outline vGate / test procedure / chips / I1 I2 I3 I4 I5 I6 Combinational I6 I5 I4 / / ProvinceOrState Virginia / / Technology Interesting chips / ITC Package chips / 28 v0.18 µm technology / 4/2006 Production Testing Production Test vEvery chip / All chips / 324 defective chips / 116 defective chips / G10P technology / received 6 / 000+ chips / simulation / Production Testing v0.14 µm technology / DSP / 26 ELF35 Chip / /
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