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Microscopy: Science, Technology, Applications and Education A. Méndez-Vilas and J. Díaz (Eds.) ______________________________________________ Measuring dielectric properties at the nanoscale using Electrostatic Force M
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Document Date: 2011-02-11 05:42:59


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City

Montpellier Cedex / San Sebastián / Toulouse / /

Country

France / Spain / United States / /

Facility

American Institute of Physics / Northeastern University / /

IndustryTerm

experimental protocol / electronics / potential applications / homogeneous and non-structured systems / satellite nodules / imaging / sharp steel knife / energy / cut using a sharp steel knife / /

NaturalFeature

PVAc / /

Organization

DC CP / France Donostia International Physics Center / American Institute of Physics / Department of Physics / American Physical Society / V AC / Northeastern University / Boston / Centre de Technologie de Montpellier / /

Person

Camille Soula / /

Position

controller / /

ProgrammingLanguage

DC / /

ProvinceOrState

Massachusetts / /

Technology

Spectroscopy / Broadband / simulation / same protocol / dielectric / /

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