![Superhard materials / Nanomaterials / Diffraction / Graphene / Low-energy electron microscopy / Silicon carbide / Low-energy electron diffraction / Bilayer graphene / Electron diffraction / Chemistry / Physics / Emerging technologies Superhard materials / Nanomaterials / Diffraction / Graphene / Low-energy electron microscopy / Silicon carbide / Low-energy electron diffraction / Bilayer graphene / Electron diffraction / Chemistry / Physics / Emerging technologies](https://www.pdfsearch.io/img/dcab79b1594d23a3f3d2c7ec2b2ee577.jpg) Date: 2014-04-16 06:40:56Superhard materials Nanomaterials Diffraction Graphene Low-energy electron microscopy Silicon carbide Low-energy electron diffraction Bilayer graphene Electron diffraction Chemistry Physics Emerging technologies | | Is the Registry Between Adjacent Graphene Layers Grown on C-Face SiC Different Compared to That on Si-Face SiC Leif Johansson, Chao Xia, Jawad ul Hassan, Tihomir Iakimov, Alexei A. Zarharov, Somsakul Watcharinyanon, RosiAdd to Reading ListSource URL: liu.diva-portal.orgDownload Document from Source Website File Size: 1,53 MBShare Document on Facebook
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