<--- Back to Details
First PageDocument Content
SI base units / Units of mass / Systems of units / 10 nanometres / Micrometer / Standard / Nanometre / Metric system / Metre / Measurement / Metrology / Units of length
Date: 2011-02-11 10:44:43
SI base units
Units of mass
Systems of units
10 nanometres
Micrometer
Standard
Nanometre
Metric system
Metre
Measurement
Metrology
Units of length

Microsoft PowerPoint - size and scale pictures (NXPowerLite).ppt

Add to Reading List

Source URL: www.nist.gov

Download Document from Source Website

File Size: 1,15 MB

Share Document on Facebook

Similar Documents

WP20: FutureJet –Cryogenic Jets of Nano- and Micrometer-Sized Particles for Hadron Physics HadronPhysics3:

WP20: FutureJet –Cryogenic Jets of Nano- and Micrometer-Sized Particles for Hadron Physics HadronPhysics3:

DocID: 1urtP - View Document

Soft X-Ray Lithography for High-Aspect Ratio Sub-Micrometer Structures S. Lemkea, J. Goettertb*, T. Holubeka, B. Löchela, I. Rudolpha and T. Seligera a  Helmholtz-Zentrum Berlin (HZB) für Materialien und Energie GmbH,

Soft X-Ray Lithography for High-Aspect Ratio Sub-Micrometer Structures S. Lemkea, J. Goettertb*, T. Holubeka, B. Löchela, I. Rudolpha and T. Seligera a Helmholtz-Zentrum Berlin (HZB) für Materialien und Energie GmbH,

DocID: 1s9p8 - View Document

Microscopy / Software / Science and technology / Academia / Scientific instruments / ImageJ / Calibration / Micrometer / Microscope / Pixel / Cover slip

Calibration of Microscope/Objectives/Camera

DocID: 1rsxu - View Document

S ME G a u ge for C a l en d ered Web Th i ckn ess P rofi l e Th e n o n -n u c l e a r s o l u ti o n The FACTS SME Gauge is THE non-nuclear solution for calendered web thickness measurement.

S ME G a u ge for C a l en d ered Web Th i ckn ess P rofi l e Th e n o n -n u c l e a r s o l u ti o n The FACTS SME Gauge is THE non-nuclear solution for calendered web thickness measurement.

DocID: 1r7LM - View Document

Meteoritics & Planetary Science 44, Nr 7, 1033–Abstract available online at http://meteoritics.org The use of Auger spectroscopy for the in situ elemental characterization of sub-micrometer presolar grains

Meteoritics & Planetary Science 44, Nr 7, 1033–Abstract available online at http://meteoritics.org The use of Auger spectroscopy for the in situ elemental characterization of sub-micrometer presolar grains

DocID: 1r1qX - View Document