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2![Soft X-Ray Lithography for High-Aspect Ratio Sub-Micrometer Structures S. Lemkea, J. Goettertb*, T. Holubeka, B. Löchela, I. Rudolpha and T. Seligera a Helmholtz-Zentrum Berlin (HZB) für Materialien und Energie GmbH, Soft X-Ray Lithography for High-Aspect Ratio Sub-Micrometer Structures S. Lemkea, J. Goettertb*, T. Holubeka, B. Löchela, I. Rudolpha and T. Seligera a Helmholtz-Zentrum Berlin (HZB) für Materialien und Energie GmbH,](https://www.pdfsearch.io/img/aa308d0a5450fc2cce16f5e8b97ea92c.jpg) | Add to Reading ListSource URL: camd.lsu.edu- Date: 2012-08-02 10:08:48
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4![S ME G a u ge for C a l en d ered Web Th i ckn ess P rofi l e Th e n o n -n u c l e a r s o l u ti o n The FACTS SME Gauge is THE non-nuclear solution for calendered web thickness measurement. S ME G a u ge for C a l en d ered Web Th i ckn ess P rofi l e Th e n o n -n u c l e a r s o l u ti o n The FACTS SME Gauge is THE non-nuclear solution for calendered web thickness measurement.](https://www.pdfsearch.io/img/c8385cfe7475b96ca9468127cd04df2e.jpg) | Add to Reading ListSource URL: www.facts-inc.comLanguage: English - Date: 2015-10-22 17:23:39
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5![Meteoritics & Planetary Science 44, Nr 7, 1033–Abstract available online at http://meteoritics.org The use of Auger spectroscopy for the in situ elemental characterization of sub-micrometer presolar grains Meteoritics & Planetary Science 44, Nr 7, 1033–Abstract available online at http://meteoritics.org The use of Auger spectroscopy for the in situ elemental characterization of sub-micrometer presolar grains](https://www.pdfsearch.io/img/4a90e86b719b33b3ad792143013af232.jpg) | Add to Reading ListSource URL: presolar.wustl.eduLanguage: English - Date: 2015-09-25 14:10:20
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6![The Sintratec Kit Quick Fact Sheet
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8![Microsoft Word - How to Measure Flatness with Optical Flats by Van Keuren.doc Microsoft Word - How to Measure Flatness with Optical Flats by Van Keuren.doc](https://www.pdfsearch.io/img/89574bb03107d588b7bc6c38d1cd0e86.jpg) | Add to Reading ListSource URL: www.gagesite.comLanguage: English - Date: 2009-07-30 09:41:31
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9![Soft X-Ray Lithography for High-Aspect Ratio Sub-Micrometer Structures S. Lemkea, J. Goettertb*, T. Holubeka, B. Löchela, I. Rudolpha and T. Seligera a Helmholtz-Zentrum Berlin (HZB) für Materialien und Energie GmbH, Soft X-Ray Lithography for High-Aspect Ratio Sub-Micrometer Structures S. Lemkea, J. Goettertb*, T. Holubeka, B. Löchela, I. Rudolpha and T. Seligera a Helmholtz-Zentrum Berlin (HZB) für Materialien und Energie GmbH,](https://www.pdfsearch.io/img/fcb7913ee54c3d7c66f04bc0a60370b1.jpg) | Add to Reading ListSource URL: www.camd.lsu.eduLanguage: English - Date: 2012-08-02 10:08:48
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10![SCOPE OF ACCREDITATION TO ISO/IEC 17025:2005 TECHNICAL SAFETY SERVICES, INC. 620 Hearst Avenue Berkeley, CAPeter Mackes SCOPE OF ACCREDITATION TO ISO/IEC 17025:2005 TECHNICAL SAFETY SERVICES, INC. 620 Hearst Avenue Berkeley, CAPeter Mackes](https://www.pdfsearch.io/img/549bf966993c3939e08384fc888649a2.jpg) | Add to Reading ListSource URL: www.techsafety.comLanguage: English - Date: 2016-04-29 08:58:59
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