![International Technology Roadmap for Semiconductors / Integrated circuit / Electronic engineering / 16 nanometer / 180 nanometer / 90 nanometer / 22 nanometer / Microtechnology / Low-k dielectric / Materials science International Technology Roadmap for Semiconductors / Integrated circuit / Electronic engineering / 16 nanometer / 180 nanometer / 90 nanometer / 22 nanometer / Microtechnology / Low-k dielectric / Materials science](https://www.pdfsearch.io/img/4f3b55c4419a3c77e14ff1125ca78c5e.jpg)
| Document Date: 2014-03-27 14:06:28 Open Document File Size: 273,63 KBShare Result on Facebook
IndustryTerm metal / interconnect/packaging architecture design optimization tool / mainstream potential solution / pre-metal dielectric / technology generations / architecture solutions / projected overall technology requirements / copper processing / energy efficiency / copper-containing chips / metallization potential solution / high throughput imaging metrology / interconnect solutions / metal structures / manufacturable solutions / possible solution / interconnect technology generations / materials solutions / meet manufacturing targets / / Position General / technology driver for the most advanced M1 pitch / conductor / technology driver / single technical product driver / / Technology radio frequency / Three-dimensional chip / flash memory / process control / Flash / copper-containing chips / dielectric / CMP / integrated circuit / /
SocialTag |