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Chemistry / Multiple patterning / Photolithography / Extreme ultraviolet / Photoresist / Ultraviolet / 32 nanometer / Nanoimprint lithography / 45 nanometer / Materials science / Electromagnetic radiation / Extreme ultraviolet lithography


PROJECT RESULT Lithography T406: Extreme UV consortium for imaging technology (ExCITe)
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Document Date: 2009-03-25 10:39:59


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City

Paris / /

Company

Sematech / SAGEM / Philips / /

Continent

Europe / /

Country

Belgium / /

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Facility

Paul Scherrer Institute / ASML Carl Zeiss CEA-Leti Clariant ELDIM Freescale IMEC Infineon INFM-TASC Philips Paul Scherrer Institute / /

/

IndustryTerm

mask-based exposure tool / lithographic imaging / ure tools / alpha tool / image tools / alpha prototype tools / scatterometry key processing technology / scale manufacturing / process equipment / chemical plat / interferometric imaging facilities / imaging / projecting the image tools / /

Organization

Information Society / EUREKA MEDEA+ Office / European Union / Paul Scherrer Institute / /

Person

Peter Zandbergen / /

/

Position

leader / co-operative / /

PublishedMedium

the Information Society / /

Technology

semiconductor / alpha / Lithography / scatterometry key processing technology / Simulation / photolithography / /

URL

http /

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