Nanometrology - PDFSEARCH.IO - Document Search Engine

Nanometrology
Results: 104

#	Item
21	BIPM Workshop on metrology at the nanoscale Day 1 – Thursday 18 February 2010 Chair Dr Alan Steele, NRC-INMS co-chairs Prof. Andrew Wallard, BIPM director & Prof. Dr Michael Kühne, BIPM deputy director Registration Add to Reading List Source URL: www.bipm.org Language: English - Date: 2013-10-15 05:12:44 International relations Metrology International organizations Standards organizations Nanometrology Kilogram International System of Units Metre Nanobiotechnology Measurement Nanotechnology SI base units
22	Nanotechnology Solutions Partner Park Systems Singapore. 33, Ubi Avenue 3, #07-47 Vertex Tower A SingaporeTel: +Mobile: +www.parkAFM.com © 2011 Park Systems Corp. All rights reserved. Add to Reading List Source URL: www.nanowerk.com Language: English - Date: 2011-11-12 18:00:00 Intermolecular forces Chemistry Atomic force microscopy Nanotechnology Park Systems Scanning electron microscope Nanometrology Vibrational analysis with scanning probe microscopy Magnetic force microscope Scientific method Science Scanning probe microscopy
23	Nanotechnology Solutions Partner Park Systems IncOlcott St. Santa Clara, CATel. +Fax. +www.parkAFM.com Park Systems Singapore. No51, Ubi Avenue 1, #06-09A Paya Ubi Industrial P Add to Reading List Source URL: www.nanowerk.com Language: English - Date: 2011-11-12 18:00:00 Chemistry Magnetic force microscope Near-field scanning optical microscope Microscopy Park Systems Scanning tunneling microscope Kelvin probe force microscope Nanometrology Chemical force microscopy Scanning probe microscopy Science Scientific method
24	Bureau International des Poids et Mesures Consultative Committee for Length (CCL) Report of the 13th meeting (13 – 14 September 2007) Add to Reading List Source URL: www1.bipm.org Language: English - Date: 2013-10-15 05:11:20 International relations International organizations Standards organizations Systems of units Nanometrology International Committee for Weights and Measures International Bureau of Weights and Measures Kilogram International System of Units Measurement Metrology SI base units
25	Bureau International des Poids et Mesures Consultative Committee for Length (CCL) Report of the 13th meeting (13 – 14 September 2007) Add to Reading List Source URL: www.bipm.org Language: English - Date: 2013-10-15 05:11:20 International relations International organizations Standards organizations Systems of units Nanometrology International Committee for Weights and Measures International Bureau of Weights and Measures Kilogram International System of Units Measurement Metrology SI base units
26	Chapter 6: Field Measurement Methods and Instrumentation Add to Reading List Source URL: www.epa.gov Language: English - Date: 2011-09-08 13:56:17 Engineering Calibration Accuracy and precision Measurement uncertainty Measuring instrument Analytical chemistry Nanometrology Custody transfer Measurement Statistics Metrology
27	S C I E N T I S T S S P E A K I N G O N Add to Reading List Source URL: www.chiefscientist.gov.au Language: English - Date: 2010-05-24 21:24:10 Emerging technologies Nanoparticle Future Time Colloidal gold Nanometrology Regulation of nanotechnology Nanotechnology Nanomaterials Materials science
28	Microsoft PowerPoint - 4-CCL report to the 25th CGPM Add to Reading List Source URL: www.bipm.org Language: English - Date: 2014-11-24 09:07:35 Dimensional metrology Metre Kilogram International System of Units Surface metrology Traceability Calibration Structured-light 3D scanner Measurement Metrology Nanometrology
29	IBM Scientists Effectively Eliminate Wear at the Nanoscale Add to Reading List Source URL: phys.org Language: English - Date: 2015-03-03 22:03:52 Science Scientific method Materials science Atomic force microscopy Nanometrology Thermal Probe Lithography Nanotechnology Scanning probe microscopy Emerging technologies
30	APRIL[removed]VOLUME 59 / NUMBER 4 BY ALAN Richter, Editor Carl Zeiss Add to Reading List Source URL: www.ctemag.com Language: English - Date: 2007-08-20 08:00:00 Engineering Measuring instruments Manufacturing Coordinate-measuring machine Sensors Engineering tolerance Camera lens Injection molding Nanometrology Metrology Measurement Technology

UPDATE