Proceedings of the International MultiConference of Engineers and Computer Scientists 2012 Vol II, IMECS 2012, March, 2012, Hong Kong A Concurrent Error Detection Based FaultTolerant 32 nm XOR-XNOR Circuit Implem

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Date: 2013-12-16 08:28:43 Logic gates Digital electronics Electronic design XOR gate XNOR gate Stuck-at fault Fault model Transistor fault OR gate Fault tolerance Pass transistor logic Exclusive or		Proceedings of the International MultiConference of Engineers and Computer Scientists 2012 Vol II, IMECS 2012, March, 2012, Hong Kong A Concurrent Error Detection Based FaultTolerant 32 nm XOR-XNOR Circuit Implem Add to Reading List Source URL: www.bpti.lt Download Document from Source Website File Size: 611,61 KB Share Document on Facebook

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