Ondrej Krivanek

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1	Microsoft PowerPoint - Soo hyoun Adv Mater Cover pieces.ppt [Compatibility Mode] Add to Reading List Source URL: www.matse.illinois.edu Language: English - Date: 2009-07-02 11:40:34 Physics Electron microscope Transmission electron microscopy Scanning electron microscope Microscope Electron Optical microscope Ondrej Krivanek Lens Scientific method Electron microscopy Science
2	Aberration-corrected scanning transmission electron microscopy: Probing individual atoms Ondrej L. Krivanek Nion Co., Kirkland, WA, USA (www.nion.com) Add to Reading List Source URL: depts.washington.edu Language: English - Date: 2011-05-19 17:42:40 Physics Microscopes Electron beam Electron energy loss spectroscopy Spectroscopy Electron microscope Scanning transmission electron microscopy Electron Transmission electron microscopy Scientific method Electron microscopy Science
3	WORKSHOP REPORT ABERRATION CORRECTION IN ELECTRON MICROSCOPY MATERIALS RESEARCH IN AN ABERRATION-FREE ENVIRONMENT Add to Reading List Source URL: ncem.lbl.gov Language: English - Date: 1970-04-13 05:20:51 Microscopes Physics Electron microscope High-resolution transmission electron microscopy Transmission electron microscopy Scanning transmission electron microscopy Ondrej Krivanek Scanning electron microscope Contrast transfer function Scientific method Electron microscopy Science