![Semiconductor device fabrication / Semiconductors / Semiconductor devices / Hot carrier injection / Negative bias temperature instability / MOSFET / Transistor / Reliability / Gate oxide / Electronic engineering / Electromagnetism / Condensed matter physics Semiconductor device fabrication / Semiconductors / Semiconductor devices / Hot carrier injection / Negative bias temperature instability / MOSFET / Transistor / Reliability / Gate oxide / Electronic engineering / Electromagnetism / Condensed matter physics](https://www.pdfsearch.io/img/878c4b1d0c5d2dcb4797eb53b93a75e6.jpg) Date: 2014-10-10 02:44:39Semiconductor device fabrication Semiconductors Semiconductor devices Hot carrier injection Negative bias temperature instability MOSFET Transistor Reliability Gate oxide Electronic engineering Electromagnetism Condensed matter physics | | TF.1 Evaluation of Self-Heating and Hot Carrier Degradation of Poly-Si Thin-Film Transistors Using Charge Pumping TechniqueAdd to Reading ListSource URL: www.pskl.ust.hkDownload Document from Source Website File Size: 297,28 KBShare Document on Facebook
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