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Deformation / Dislocation / Plasticity / Solid mechanics / Wafer / Czochralski process / Annealing / Rapid thermal processing / Hardening / Materials science / Semiconductor device fabrication / Crystallographic defects
Date: 2007-07-29 11:21:42
Deformation
Dislocation
Plasticity
Solid mechanics
Wafer
Czochralski process
Annealing
Rapid thermal processing
Hardening
Materials science
Semiconductor device fabrication
Crystallographic defects

Microelectronic Engineering[removed]–130 www.elsevier.com / locate / mee The use of numerical simulation to predict the unlocking stress of dislocations in Cz-silicon wafers a,

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