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Date: 2015-07-18 01:30:09 Electronic engineering Semiconductor devices Negative-bias temperature instability Semiconductor device fabrication Hot-carrier injection Semiconductor intellectual property core Transistor		Microsoft Word - PR-NBTI_June7 Add to Reading List Source URL: www.ridgetopgroup.com Download Document from Source Website File Size: 75,12 KB Share Document on Facebook

	Application Note \| AN111 ProChek Hot Carrier Injection (HCI) Measurements for the ON Semiconductor ONC18 Process Introduction Today’s microelectronic circuits are designed for high performance and long life in a wide r DocID: 1qA5H - View Document
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	Copyright © 2012 American Scientiﬁc Publishers All rights reserved Printed in the United States of America Journal of Low Power Electronics DocID: 1l9dR - View Document
	SISPAD 2012, September 5-7, 2012, Denver, CO, USA Development of Predictive Model and Circuit Simulation Methodology for Negative Bias Temperature Instability Effects C. Ma, H. J. Mattausch, M. Miyake, DocID: 1kKXk - View Document