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Physics / Technology / MOSFET / Capacitance / Depletion region / Diode / P–n junction / Capacitor / Field-effect transistor / Scanning probe microscopy / Scanning capacitance microscopy / Electromagnetism
Date: 2009-12-27 18:00:00
Physics
Technology
MOSFET
Capacitance
Depletion region
Diode
P–n junction
Capacitor
Field-effect transistor
Scanning probe microscopy
Scanning capacitance microscopy
Electromagnetism

Mode Note Scanning Capacitance Microscopy (SCM) High Resolution and High Sensitivity Imaging of Charge Distribution Characterization of Semiconductor Device with Non-Destructive Technique and High Spatial Resolution

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