![Physics / Technology / MOSFET / Capacitance / Depletion region / Diode / P–n junction / Capacitor / Field-effect transistor / Scanning probe microscopy / Scanning capacitance microscopy / Electromagnetism Physics / Technology / MOSFET / Capacitance / Depletion region / Diode / P–n junction / Capacitor / Field-effect transistor / Scanning probe microscopy / Scanning capacitance microscopy / Electromagnetism](https://www.pdfsearch.io/img/5ecb65b1691daca4bbe8415e0738f703.jpg) Date: 2009-12-27 18:00:00Physics Technology MOSFET Capacitance Depletion region Diode P–n junction Capacitor Field-effect transistor Scanning probe microscopy Scanning capacitance microscopy Electromagnetism | | Mode Note Scanning Capacitance Microscopy (SCM) High Resolution and High Sensitivity Imaging of Charge Distribution Characterization of Semiconductor Device with Non-Destructive Technique and High Spatial ResolutionAdd to Reading ListSource URL: www.nanowerk.comDownload Document from Source Website File Size: 904,57 KBShare Document on Facebook
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