NanoTech1401002AgeevILO.fm

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Date: 2015-01-20 05:11:10 Electron microscopy Semiconductor device fabrication Thin film deposition Microtechnology Focused ion beam Ion beam Microelectromechanical systems Scanning electron microscope Nanotechnology Physics Scientific method Science		NanoTech1401002AgeevILO.fm Add to Reading List Source URL: www.ntmdt.com Download Document from Source Website File Size: 871,39 KB Share Document on Facebook

	IEEE TRANSACTIONS ON MAGNETICS, VOL. 37, NO. 4, JULYMagnetic Properties of Fe Microstructures with Focused Ion Beam-Fabricated Nano-Constrictions DocID: 1vfvg - View Document
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