Date: 2012-08-26 06:50:01

Electron microscopy

Nanotechnology

Microtechnology

Semiconductor device fabrication

Electron beam

Electron beam-induced deposition

Electron microscope

Microfabrication

Scanning electron microscope

Photolithography

Focused ion beam

ENHANCE – MC-ITN European Research Training Network of New Materials: Innovative Concepts for their Fabrication, Integration and Characterization Workshop WS-7. Nanostructuring methods utilising electron & ion beam pro

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