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Electron beam-induced deposition
Results: 7

#	Item
1	ENHANCE – MC-ITN European Research Training Network of New Materials: Innovative Concepts for their Fabrication, Integration and Characterization Workshop WS-7. Nanostructuring methods utilising electron & ion beam pro Add to Reading List Source URL: www.enhance-itn.eu Language: English - Date: 2012-08-26 06:50:01 Electron microscopy Nanotechnology Microtechnology Semiconductor device fabrication Electron beam Electron beam-induced deposition Electron microscope Microfabrication Scanning electron microscope Photolithography Focused ion beam
2	Surface excitations in the modelling of electron transport for electron-beam-induced deposition experiments Francesc Salvat-Pujol1, Roser Valentí1 and Wolfgang S. Werner2 Review Address: Add to Reading List Source URL: www.beilstein-journals.org Language: English* - Date: 2015-06-03 03:37:45
3	European Cooperation Brussels, 24 May 2013 in the field of Scientific and Technical Research Add to Reading List Source URL: w3.cost.eu Language: English - Date: 2013-05-27 05:55:48 Physics Chemistry Electron beam Nanotechnology Emerging technologies Electron beam-induced deposition Electron microscope Electron X-ray crystallography Science Scientific method Electron microscopy
4	F r a u n h o f e r I n s t i t u t e f o r I n t e g r at e d S y s t e m s a n d D e v i c e T e c h n o l o g y 1 2 Add to Reading List Source URL: www.iisb.fraunhofer.de Language: English - Date: 2015-06-08 13:41:42 Manufacturing Thin film deposition Superhard materials Electron beam Electron beam induced current Silicon carbide Fraunhofer Society Epitaxy Micropipe Chemistry Semiconductor device fabrication Materials science
5	CrossMark_Color_Stacked_p Add to Reading List Source URL: vandersypenlab.tudelft.nl Language: English - Date: 2014-05-21 12:26:50 Electron microscopy Electron beam Abrasives Ceramic materials Graphene Electron beam-induced deposition Electron beam lithography Boron nitride Electron microscope Chemistry Matter Superhard materials
6	Supplementary Material for “Characterization and reduction of microfabrication-induced decoherence in superconducting quantum circuits” C. M. Quintana,1 A. Megrant,1 Z. Chen,1 A. Dunsworth,1 B. Chiaro,1 R. Barends,1 Add to Reading List Source URL: web.physics.ucsb.edu Language: English - Date: 2014-08-14 14:18:10 Semiconductor device fabrication Science Thin film deposition Physics Electromagnetism Electron beam lithography Focused ion beam Resonator Electron microscope Materials science Microtechnology Electron microscopy
7	FRAUNHOFER CAM IS A COMPETENCE CENTER FOR MICROSTRUCTURE DIAGNOSTICS A N D M AT E R I A L C H A R A C T E R I Z AT I O N WITHIN FRAUNHOFER IWM IN HALLE FRAUNHOFER CENTER Add to Reading List Source URL: www.iwm.fraunhofer.de Language: English - Date: 2014-05-20 04:29:23 Semiconductor device fabrication Thin film deposition Electron beam Focused ion beam Failure analysis Electron beam induced current Electron microscope Scanning electron microscope Electron backscatter diffraction Scientific method Science Electron microscopy