APPENDIX 3 ANCILLARY TECHNIQUES A number of ancillary techniques are very commonly employed in conjunction with reflected-light microscopy in order to obtain more detailed information on the identities and compositions

First Page		Document Content
Date: 2013-04-23 12:02:53 Electron microscopy Microscopes Spectroscopy Measuring instruments Materials science Electron microscope Electron microprobe Scanning electron microscope Microprobe Scientific method Science Chemistry		APPENDIX 3 ANCILLARY TECHNIQUES A number of ancillary techniques are very commonly employed in conjunction with reflected-light microscopy in order to obtain more detailed information on the identities and compositions Add to Reading List Source URL: www.minsocam.org Download Document from Source Website File Size: 2,60 MB Share Document on Facebook

	Microscopy Imaging Center (MIC) MIC Workshop: IMOD software for electron tomography DocID: 1vieY - View Document
	© The Royal Microscopical Society ● A special issue on Environmental Electron Microscopy (ESEM, ETEM, gas/liquid cells) ● based on communications presented at EMC2016 DocID: 1v9b2 - View Document
	PHYSICAL AND CHEMICAL IMPACTS ON THE INTEGRITY OF CERATIUM CELLS: A SCANNING ELECTRON MICROSCOPY INVESTIGATION AFTER CONVENTIONAL SEDIMENTATION H. Ewerts1, 2, S. Barnard1 & A. Swanepoel2 1 DocID: 1v2se - View Document
	Deep Learning for Isotropic Super-Resolution from Non-Isotropic 3D Electron Microscopy arXiv:1706.03142v1 [cs.CV] 9 JunLarissa Heinrich, John A. Bogovic, Stephan Saalfeld DocID: 1v2hf - View Document
	Symposium of the Microscopy Imaging Center MIC Big data in light and electron microscopy DocID: 1uWgw - View Document