APPENDIX 3 ANCILLARY TECHNIQUES A number of ancillary techniques are very commonly employed in conjunction with reflected-light microscopy in order to obtain more detailed information on the identities and compositions - Scanning electron microscope - Document - PDFSEARCH.IO

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	APPENDIX 3 ANCILLARY TECHNIQUES A number of ancillary techniques are very commonly employed in conjunction with reflected-light microscopy in order to obtain more detailed information on the identities and compositions Add to Reading List Document Date: 2013-04-23 12:02:53 Open Document File Size: 2,60 MB Share Result on Facebook City Toronto / Ottawa / New York / Wiley / / Company Cambridge University Press / Plenum Press / Echlin / SEMs / McGraw-Hill / / Continent America / / Country Canada / United Kingdom / / IndustryTerm mil1 products / co mplete chemical analysis / sharp metal / electricity / computer-based image analysis systems / image analysis systems / nd applications / computer processing / platinum / chemical compositional data / chemical analysis / energy / / Organization Cambridge University / Mineral Assoc. / / Person Ray Microanalysis / F. White / Todd Solb / Ray Crystallography / Van Nostrand Reinhold / / Position mineralogist / analysis mayor / / ProvinceOrState D. C / New York / / Technology radiation / laser / X-ray / fracturing / / SocialTag Electron microscopy Microscopes Spectroscopy Measuring instruments Materials science Electron microscope Electron microprobe Scanning electron microscope Microprobe Scientific method

APPENDIX 3 ANCILLARY TECHNIQUES A number of ancillary techniques are very commonly employed in conjunction with reflected-light microscopy in order to obtain more detailed information on the identities and compositions Add to Reading List