Scanning voltage microscopy

Results: 8



#Item
1Electrophysiology / Neurophysiology / Scanning probe microscopy / Ion channels / Cell communication / Patch clamp / Atomic-force microscopy / Voltage clamp / Membrane potential / Force spectroscopy / Automated patch clamp

doi:j.ultramic

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Source URL: www.biophysik.physik.uni-muenchen.de

Language: English - Date: 2015-11-11 09:32:04
2Microscopes / Scanning tunneling microscope / Field electron emission / Work function / Electron / Rectangular potential barrier / Scanning tunneling spectroscopy / Physics / Scanning probe microscopy / Quantum mechanics

hh tt tt pp :: // // ww ww ww .. nn tt m m dd tt .. cc oo m m "Observed" Physical Quantities in STM Current-Voltage Characteristic

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Source URL: www.ntmdt.com

Language: English - Date: 2008-01-29 12:02:36
3Physics / Electron microscope / Microscope / Scanning electron microscope / Electron / Image resolution / Low-voltage electron microscope / Scientific method / Electron microscopy / Science

Harvard University & Boston University School of Medicine In order to generate large volumetric datasets of brain tissue, we have developed an automated pipeline to section, and image neural circuits in brain samples. We

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Source URL: www.iarpa.gov

Language: English - Date: 2014-07-30 14:15:13
4Waves / Analog circuits / Wave mechanics / Voltage divider / Amplitude / Resistor / Voltage / Scanning SQUID microscopy / Electrical impedance / Physics / Physical quantities / Electromagnetism

Worksheet for Exploration 31.1: Amplitude, Frequency and Phase Shift We characterize the voltage (or current) in AC circuits in terms of the amplitude, frequency (period) and phase. The sinusoidal voltage of this functio

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Source URL: www.compadre.org

Language: English - Date: 2013-05-21 23:33:44
5Electronics / Technology / Electrical impedance / Soil physics / Microelectronics / Scanning probe microscopy / Time-domain reflectometer / Scanning voltage microscopy / Electromagnetism / Electronic engineering / Time-domain reflectometry

Time Domain Reflectometry (TDR) is a nondestructive fault isolation technique used in the microelectronics industry for several years. This technique allows the localization of electrical failures, prior to destructive i

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Source URL: www.c2mi.ca

Language: English - Date: 2014-11-24 15:45:43
6Microscopy / Royal Microscopical Society / Low-voltage electron microscope / Scanning probe microscopy / Electron microscope / Scientific method / Science / Electron microscopy

Price List Place your order online at wiley.com using Promotion Code[removed]to receive the Conference Discount - valid until October 12, 2014 *Discount is not redeemable against e-books or orders placed through other Reta

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Source URL: www.wiley-vch.de

Language: English - Date: 2014-08-20 09:47:27
7Thermal conductivity / Coherence / Electron / Voltage / Coherent backscattering / Scanning SQUID microscopy / Physics / Physical quantities / Electrical resistivity and conductivity

California Institute of Technology Physics 77 Weak Localization Eric D. Black

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Source URL: www.pma.caltech.edu

Language: English - Date: 2011-11-08 12:35:31
8Scanning probe microscopy / Charge carriers / Ballistic electron emission microscopy / Schottky barrier / Ohmic contact / Hot carrier injection / Inelastic electron tunneling spectroscopy / Work function / Threshold voltage / Physics / Condensed matter physics / Electromagnetism

Microsc. MicroanaL Microstruct. 31-

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Source URL: mmm.edpsciences.org

Language: English
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