Semiconductor fault diagnostics

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1	White Paper Using TetraMAX® Physical Diagnostics for Advanced Yield Analysis Improving Defect Isolation with Layout Data January 2010 Add to Reading List Source URL: www.synopsys.com Language: English - Date: 2014-11-07 14:31:30 Electronic design automation Automatic test pattern generation Integrated circuits Maintenance Electronic design Fault Failure analysis Semiconductor fault diagnostics Design for testing Electronic engineering Geology Design