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#	Item
151	ICFA Instrumentation Bulletin BEAM TESTS OF THE CLEO III LIF-TEA RING IMAGING CHERENKOV DETECTOR M. Artuso, F. Azfar, A. Emov, S. Kopp, R. Mountain, S. Schuh, T. Skwarnicki, S. Stone, and G. Viehhauser Add to Reading List Source URL: www.slac.stanford.edu Language: English - Date: 1997-11-24 20:47:36 Quantum electrodynamics Ring-imaging Cherenkov detector CERN Large Hadron Collider Cherenkov radiation Detection of internally reflected Cherenkov light CLEO Photon LHCb Physics Particle physics Particle detectors
152	Fraunhofer Institute for Reliability and M i c r o i n t e g r at i o n I Z M Focused Ion Beam • Design parameter effect analysis (geometry, material, load profile) Add to Reading List Source URL: www.izm.fraunhofer.de Language: English - Date: 2015-02-12 09:57:08 Reliability Measuring instrument Thermomechanical analysis Failure analysis Electron microscope Dynamic mechanical analysis Atomic force microscopy Characterization MIL-STD-883 Science Materials science Scientific method
153 $Semiconductor device fabrication / Surface chemistry / Thin film deposition / Gallium arsenide / Superlattice / Reflection high-energy electron diffraction / Heterojunction / Gallium nitride / Desorption / Chemistry / Compound semiconductors / Inorganic compounds$	Kinetic modeling of microscopic processes during electron cyclotron resonance microwave plasma-assisted molecular beam epitaxial growth of GaN/GaAs-based heterostructures Z. Z. Bandic´a) T. J. Watson, Sr., Laboratories Add to Reading List Source URL: authors.library.caltech.edu Language: English - Date: 2012-12-26 03:58:21 Semiconductor device fabrication Surface chemistry Thin film deposition Gallium arsenide Superlattice Reflection high-energy electron diffraction Heterojunction Gallium nitride Desorption Chemistry Compound semiconductors Inorganic compounds
154	VOLUME 93, N UMBER 15 PHYSICA L R EVIEW LET T ERS week ending 8 OCTOBER 2004 Add to Reading List Source URL: www.ece.rice.edu Language: English - Date: 2004-10-09 12:15:21 Spectroscopy Photonics Electron beam Electromagnetically induced transparency Optics Franz–Keldysh effect Laser Infrared Absorption spectroscopy Electromagnetic radiation Physics Waves
155	A C C O M M O D AT I O N \| D I R E C T I O N S FOREWORD FRAUNHOFER INSTITUTE FOR ORGANIC ELECTRONICS, ELECTRON BEAM AND PLASMA TECHNOLOGY FEP Add to Reading List Source URL: www.fep.fraunhofer.de Language: English - Date: 2015-04-06 09:27:52 Thin-film optics Semiconductor device fabrication Windows Thin film deposition Fraunhofer Society Sputter deposition Optical coating Thin film Layer Materials science Technology Chemistry
156 $Semiconductor device fabrication / Thin film deposition / Electron beam / Focused ion beam / Failure analysis / Electron beam induced current / Electron microscope / Scanning electron microscope / Electron backscatter diffraction / Scientific method / Science / Electron microscopy$	FRAUNHOFER CAM IS A COMPETENCE CENTER FOR MICROSTRUCTURE DIAGNOSTICS A N D M AT E R I A L C H A R A C T E R I Z AT I O N WITHIN FRAUNHOFER IWM IN HALLE FRAUNHOFER CENTER Add to Reading List Source URL: www.iwm.fraunhofer.de Language: English - Date: 2014-05-20 04:29:23 Semiconductor device fabrication Thin film deposition Electron beam Focused ion beam Failure analysis Electron beam induced current Electron microscope Scanning electron microscope Electron backscatter diffraction Scientific method Science Electron microscopy
157	F R A U N H O F E R I N S T I T U T E F O R M E C H A N I C S O F M AT E R I A L S I W M COMPONENTS IN MICROELECTRONICS AND MICROSYSTEMS TECHNOLOGY Your competent partner for Add to Reading List Source URL: www.en.iwm.fraunhofer.de Language: English - Date: 2011-11-18 03:55:18 Technology Electron microscopy Failure Thin film deposition Microtechnology Microelectromechanical systems Failure analysis Wafer bonding Focused ion beam Science Semiconductor device fabrication Scientific method
158	BROOKHAVEN SUPERCONDUCTING DC BEAM MAGNETS* R.B.. B r i t t o n Brookhaven National Laboratory Add to Reading List Source URL: www.bnl.gov Language: English - Date: 2008-02-22 18:08:32 Classical cipher International Obfuscated C Code Contest Computer programming Computing Software engineering
159	T. J. Wipf, F. W. Klaiber, A. Prabhakaran Evaluation of Bridge Replacement Alternatives for the County Bridge System August 1994 Add to Reading List Source URL: publications.iowa.gov Language: English - Date: 2012-11-12 10:50:02 Civil engineering Construction Beam bridge Architecture Precast concrete Prestressed concrete Girder bridge Ostap "Joe" Bender Cable-stayed bridge Bridges Concrete Structural engineering
160	Surface science for improved ion traps D.A. Hite, Y. Colombe, A.C. Wilson, D.T.C. Allcock, D. Leibfried, D.J. Wineland, and D.P. Pappas Trapped ions are sensitive to electric-field noise from trap-electrode surfaces. Thi Add to Reading List Source URL: www.nist.gov Language: English - Date: 2014-01-17 14:04:38 Measuring instruments Astrophysics Ion trap Quadrupole ion trap Atomic physics Plasma Trapped ion quantum computer Electron beam ion trap Chemistry Mass analyzer Physics

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