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Semiconductors / Semiconductor device fabrication / Semiconductor devices / Failure / Hot carrier injection / Negative bias temperature instability / Reliability / MOSFET / Threshold voltage / Electronic engineering / Electromagnetism / Technology
Date: 2013-06-24 10:52:29
Semiconductors
Semiconductor device fabrication
Semiconductor devices
Failure
Hot carrier injection
Negative bias temperature instability
Reliability
MOSFET
Threshold voltage
Electronic engineering
Electromagnetism
Technology

Microsoft Word - Bernstein Handbook - Nicholls Mods.doc

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