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Semiconductors / Semiconductor device fabrication / Semiconductor devices / Failure / Hot carrier injection / Negative bias temperature instability / Reliability / MOSFET / Threshold voltage / Electronic engineering / Electromagnetism / Technology


Microsoft Word - Bernstein Handbook - Nicholls Mods.doc
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Document Date: 2013-06-24 10:52:29


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File Size: 555,32 KB

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