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Chemistry / Nanotechnology / Magnetic force microscope / Atomic force microscopy / Cantilever / Focused ion beam / Microscopy / Scanning joule expansion microscopy / Thermal Probe Lithography / Scientific method / Scanning probe microscopy / Science


IEEE TRANSACTIONS ON MAGNETICS, VOL. 38, NO. 5, SEPTEMBER[removed]The CantiClever: A Dedicated Probe for Magnetic Force Microscopy
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Document Date: 2011-08-28 10:51:13

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