IBM Scientists Effectively Eliminate Wear at the Nanoscale

First Page		Document Content
Date: 2015-03-03 22:03:52 Science Scientific method Materials science Atomic force microscopy Nanometrology Thermal Probe Lithography Nanotechnology Scanning probe microscopy Emerging technologies		IBM Scientists Effectively Eliminate Wear at the Nanoscale Add to Reading List Source URL: phys.org Download Document from Source Website File Size: 26,80 KB Share Document on Facebook

	UPB - INVESTIGACIÓN & DESARROLLO No 13, Vol. 1 : 56 – MICROSTRUCTURAL CHARACTERIZATION MIXTURES BY ATOMIC FORCE MICROSCOPY OF DocID: 1ugz1 - View Document
	Technology Opportunity, Ref. No. UAA novel algorithm for phase computation in atomic force microscopy A novel algorithm has been developed which provides highly accurate phase measurements. In particular, the al DocID: 1rmSQ - View Document
	Methods–178 Contents lists available at SciVerse ScienceDirect Methods journal homepage: www.elsevier.com/locate/ymeth DocID: 1rhji - View Document
	NANOSCOPY APPLICATION NOTE M05 Scanning Probe Microscopes for extreme Environments DocID: 1r6wn - View Document
	Journal of Photochemistry and Photobiology A: Chemistry–154 Nanopatterning with conformable phase masks Joana Maria a , Seokwoo Jeon a , John A. Rogers a,b,∗ a DocID: 1r33C - View Document