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Science / Scientific method / Materials science / Atomic force microscopy / Nanometrology / Thermal Probe Lithography / Nanotechnology / Scanning probe microscopy / Emerging technologies


IBM Scientists Effectively Eliminate Wear at the Nanoscale
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Document Date: 2015-03-03 22:03:52

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City

Zurich / /

Company

IBM / /

IndustryTerm

probe technology / metrology systems / computer chips / characterization tools / technology nodes / nanoscale devices / manufacturing / industrial applications / possible applications / generation chips / /

Person

Mark Lantz / Bernd Gotsmann / /

Position

record player / scientist / /

PublishedMedium

Nature Nanotechnology / /

Technology

semiconductor / computer chips / generation chips / scanning probe technology / probe-based technologies / /

URL

www.tcpdf.org / http /

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