Wafer backgrinding

Results: 6



#Item
1Semiconductor device fabrication / Electronic engineering / Technology / Electromagnetism / Wafer backgrinding / Wafer / Integrated circuit packaging / Roll-to-roll processing / Integrated circuit / Wafer dicing

F R A U N H O F E R re s ear c h I n s t i t u t ion for M i c ro s y s t em s an d So l i d S tat e Te c hno l o g ie s E M F T 2 1

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Source URL: www.emft.fraunhofer.de

Language: English - Date: 2015-11-12 01:37:49
2Semiconductor device fabrication / Integrated circuits / Electronic engineering / Electronics / Electromagnetism / Packaging / Three-dimensional integrated circuit / Through-silicon via / Fraunhofer Society / Wafer backgrinding / Wafer

F R A U N H O F E R I N S T I T U T E F o R R e l ia b i l it y an d M i C roin T e g ration I Z M Fraunhofer IZM – ASSID All Silicon System Integration Dresden YEARS

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Source URL: www.izm.fraunhofer.de

Language: English - Date: 2016-05-25 07:28:49
3Electronic engineering / Dynamic random-access memory / Wafer backgrinding / ANT / Wafer / Three-dimensional integrated circuit / Through-silicon via / Semiconductor device fabrication / Technology / Electronics

Low-Cost 3D Chip Stacking with ThruChip Wireless Connections [removed] [removed] [removed]

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Source URL: www.hotchips.org

Language: English - Date: 2014-08-04 13:35:25
4Physics / Electricity / Electrical safety / Electrical breakdown / Electrostatics / Electrostatic discharge / Three-dimensional integrated circuit / Through-silicon via / Wafer backgrinding / Electromagnetism / Semiconductor device fabrication / Integrated circuits

3D IC integration and ESD: “Not the ESD you grew up with!” Stephen Fairbanks Managing Director

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Source URL: www.gsaglobal.org

Language: English - Date: 2014-01-22 10:41:25
5Technology / Three-dimensional integrated circuit / Wafer backgrinding / Wafer dicing / Wafer / Through-silicon via / Microelectromechanical systems / SUSS MicroTec / Chemical-mechanical planarization / Semiconductor device fabrication / Microtechnology / Electronics

j431 Index a acoustic microscopy 406, 407 – bonded wafer thickness, measuring 417

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Source URL: www.wiley-vch.de

Language: English - Date: 2014-03-31 21:03:45
6Electronics / Integrated circuit / Wafer / Through-silicon via / Silicon / Three-dimensional integrated circuit / Wafer backgrinding / Semiconductor device fabrication / Chemistry / Microtechnology

Ziptronix and Customer Pursue Lower-Cost 3D Memory With DBI® Wafer Bonding and Interconnect Technology Ability to Replace Die Stacking with High-strength Wafer Stacking Simplifies Process Flows, Increases Interconnect D

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Source URL: www.ziptronix.com

Language: English - Date: 2012-12-12 11:53:15
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