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Electronics / Integrated circuits / Electronic design / Design for X / Design for testing / Very-large-scale integration / Digital electronics / Standard cell / Application-specific integrated circuit / Electronic engineering / Design / Electronic design automation
Date: 2008-07-16 20:04:16
Electronics
Integrated circuits
Electronic design
Design for X
Design for testing
Very-large-scale integration
Digital electronics
Standard cell
Application-specific integrated circuit
Electronic engineering
Design
Electronic design automation

TECHNIQUES FOR AUTOMATIC TEST KNOWLEDGE EXTRACTION FROM COMPILED CIRCUITS BY KURT HENRY THEARLING B.S.E., University of Michigan, 1985

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