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TECHNIQUES FOR AUTOMATIC TEST KNOWLEDGE EXTRACTION FROM COMPILED CIRCUITS BY KURT HENRY THEARLING B.S.E., University of Michigan, 1985
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Document Date: 2008-07-16 20:04:16


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File Size: 3,77 MB

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City

Urbana / /

Company

DELPHI / /

Event

Product Issues / /

Facility

Computer Engineering University of Illinois / Graduate College / University of Illinois / University of Michigan / /

IndustryTerm

design tools / silicon compilation tools / digital systems / level synthesis tools / chip manufacturing technology / chip manufacturer / present various applications / large test generation search space / test generation search / test generation systems / /

Organization

Graduate College / University of Illinois / University of Michigan / Center for Reliable and High-Performance Computing / /

Person

Jeff Baxter / Jacob Abraham / Marc Levitt / Tom Niermann / Randy Brouwer / Paul Chen / KURT HENRY THEARLING / Ralph Kling / Kurt Henr / /

Position

advisor / circuit designer / Professor / designer / /

Product

ability / par ts / /

ProvinceOrState

Illinois / Michigan / /

Technology

fabricated chip / integrated circuits / chip manufacturing technology / /

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