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Charge trap flash
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Microsoft Word - HTC Workshops.doc
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Source URL: eds.ieee.org
Language: English
- Date: 2012-02-07 15:25:31
IEEE Electron Devices Society
Engineering
Institute of Electrical and Electronics Engineers
Siegfried Selberherr
Stephen A. Parke
Symposium on VLSI Circuits
Charge trap flash
Semiconductors
Electronic engineering
International Electron Devices Meeting
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