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Siegfried Selberherr
Results: 11

#	Item
1	SISPAD 2012, September 5-7, 2012, Denver, CO, USA Study of Self-Accelerating Switching in MTJs with Composite Free Layer by Micromagnetic Simulations Alexander Makarov, Viktor Sverdlov, and Siegfried Selberherr Add to Reading List Source URL: in4.iue.tuwien.ac.at Language: English - Date: 2013-02-12 08:39:09
2	SISPAD 2012, September 5-7, 2012, Denver, CO, USA A Robust and Efficient MTJ-based Spintronic IMP Gate for New Logic Circuits and Large-Scale Integration Hiwa Mahmoudi, Viktor Sverdlov, and Siegfried Selberherr Add to Reading List Source URL: in4.iue.tuwien.ac.at Language: English - Date: 2013-02-12 08:39:05
3	JANUARY 2013 VOL. 20, NO. 1 ISSN: TABLE OF Add to Reading List Source URL: eds.ieee.org Language: English - Date: 2012-12-21 11:20:35 Institute of Electrical and Electronics Engineers Measurement Electronics engineers IEEE Technical Activities Board Siegfried Selberherr Engineering Electronic engineering IEEE Electron Devices Society
4	E LECTRON DEVICES S OCIETY IEEE ELECTRON DEVICES SOCIETY ISSN: Add to Reading List Source URL: eds.ieee.org Language: English - Date: 2012-02-07 15:25:26 Professional associations Standards organizations IEEE Electron Devices Society Semiconductors Technology Institute of Electrical and Electronics Engineers Siegfried Selberherr ISPSD International Electron Devices Meeting Electronic engineering Engineering International nongovernmental organizations
5	IEEE E D S ELECTRON DEVICES SOCIETY Add to Reading List Source URL: eds.ieee.org Language: English - Date: 2012-02-07 15:25:27 IEEE Electron Devices Society Semiconductors International Electron Devices Meeting IEEE Technical Activities Board Ilesanmi Adesida Siegfried Selberherr IEEE Consumer Electronics Society Electronic engineering Engineering Institute of Electrical and Electronics Engineers
6	Microsoft Word - HTC Workshops.doc Add to Reading List Source URL: eds.ieee.org Language: English - Date: 2012-02-07 15:25:31 IEEE Electron Devices Society Engineering Institute of Electrical and Electronics Engineers Siegfried Selberherr Stephen A. Parke Symposium on VLSI Circuits Charge trap flash Semiconductors Electronic engineering International Electron Devices Meeting
7	E D S July 2003 Vol. 10, No. 3 ISSN:Editor-in-Chief: Ninoslav D. Stojadinovic Add to Reading List Source URL: eds.ieee.org Language: English - Date: 2012-02-07 15:25:16 IEEE Electron Devices Society International Electron Devices Meeting Institute of Electrical and Electronics Engineers Electronics engineers Siegfried Selberherr IEEE Consumer Electronics Society Electronic engineering Semiconductors Engineering
8	14eds02.qxd:58 PM Add to Reading List Source URL: eds.ieee.org Language: English - Date: 2012-02-07 15:25:20 Professional associations Standards organizations IEEE Electron Devices Society Semiconductors Siegfried Selberherr International Electron Devices Meeting IEEE Nanotechnology Council Ilesanmi Adesida IEEE Technical Activities Board Institute of Electrical and Electronics Engineers Electronic engineering International nongovernmental organizations
9	IEEE Electron Devices Society Newsletter January 2003 Vol. 10, No. 1 ISSN:Editor-in-Chief: Ninoslav D. Stojadinovic Add to Reading List Source URL: eds.ieee.org Language: English - Date: 2012-02-07 15:25:14 IEEE Electron Devices Society IEEE Transactions on Semiconductor Manufacturing International Electron Devices Meeting Ilesanmi Adesida Siegfried Selberherr IEEE Technical Activities Board Institute of Electrical and Electronics Engineers Engineering Electronic engineering
10	E LECTRON DEVICES S OCIETY IEEE ELECTRON DEVICES SOCIETY ISSN: Add to Reading List Source URL: eds.ieee.org Language: English - Date: 2012-02-07 15:25:27 Semiconductors IEEE Electron Devices Society International Electron Devices Meeting Ilesanmi Adesida George H. Heilmeier IEEE Circuits and Systems Society Siegfried Selberherr IEEE Technical Activities Board Institute of Electrical and Electronics Engineers Electronic engineering International nongovernmental organizations