Cincinnati / Briarcliff Manor / Sapporo / San Francisco / Au / Dallas / Washington DC / Hyannis / Santa Barbara / Burlington / Nagaoka / Kissimmee / Brighton / Freiburg / East Fishkill / Boulder / Lauderdale / Paris / Stockholm / Tokyo / Manchester / Kyoto / Pittsburgh / Rabat / Indianapolis / Amsterdam / Milan / Santa Cruz / Denver / Monterey / Orlando / Karuizawa / Fukui / Seattle / Strasbourg / Charlottesville / Whistler / Pasadena / Valencia / Boston / Base / Baltimore / Somerville / Newport / Washington / DC / Leuven / Berlin / Cannes / Rome / Atlanta / Phoenix / Cambridge / Cardiff / Danvers / Amherst / Los Angeles / Montpellier / Lausanne / Luxor / Lexington / Ronneby / London / Nagoya / Santa Rosa / San Diego / Hilton Head Island / Mertens / Edinburgh / Williamsburg / /
Country
Switzerland / Netherlands / Egypt / France / Japan / Canada / United Kingdom / Wales / Germany / Italy / Sweden / Belgium / Russia / United States / Columbia / Singapore / Morocco / Spain / /
Facility
University of South Maine / Institute of Physics Conference Series / Stanford University / Polytechnic University / Hanscom Air Force Base / University of Waterloo / Enabled Remote Laboratory / The Institute of Electrical Engineers / Hall Scattering Factor / Institute Committees / Polytechnic University of Madrid / Prentice Hall / Institute of Electronics / University of Massachusetts Physics Colloquium / /
IndustryTerm
metal / Internet era / manufacturing / Wireless Components Letters / electronics / Web Services / /
RC-12 / IL-13 / A New Drain-Current Injection / IL-31 / /
ProvinceOrState
Ohio / Virginia / Maine / Indiana / New York / Washington / Rhode Island / Nova Scotia / California / Georgia / Arizona / Colorado / Ontario / Texas / Maryland / South Dakota / Pennsylvania / Florida / Massachusetts / /
PublishedMedium
Semiconductor Science and Technology / Japanese Journal of Applied Physics / Journal of Applied Physics / Applied Physics Letters / IEEE Transactions on Semiconductor Manufacturing / Student Life / IEEE Journal of Quantum Electronics / Journal of Electronic Materials / Physical Review Letters / /
June 2004 Jesús A. del Alamo Professor of Electrical Engineering