<--- Back to Details
First PageDocument Content
Semiconductor device fabrication / Solder / Reliability / Integrated circuit / Welding / Wire bonding / Flip chip / Ball grid array / Flux
Date: 2016-01-20 13:47:56
Semiconductor device fabrication
Solder
Reliability
Integrated circuit
Welding
Wire bonding
Flip chip
Ball grid array
Flux

MICROELECTRONICS ASSEMBLY Microelectronics Assembly With over four decades of experience in high reliability hybrid and RF technologies, NEO Tech has emerged as North America’s largest microelectronics assembler. The m

Add to Reading List

Source URL: www.neotech.com

Download Document from Source Website

File Size: 774,86 KB

Share Document on Facebook

Similar Documents

MICROELECTRONICS ASSEMBLY Microelectronics Assembly With over four decades of experience in high reliability hybrid and RF technologies, NEO Tech has emerged as North America’s largest microelectronics assembler. The m

MICROELECTRONICS ASSEMBLY Microelectronics Assembly With over four decades of experience in high reliability hybrid and RF technologies, NEO Tech has emerged as North America’s largest microelectronics assembler. The m

DocID: 1px4a - View Document

RGSJBIST PRODUCT BRIEF E N G I N E E R I N G  I N N O V A T I O N

RGSJBIST PRODUCT BRIEF E N G I N E E R I N G I N N O V A T I O N

DocID: 1pcLh - View Document

A4.7 (C. Koos/ N. Lindenmann) [A4.7:1] * N. Lindenmann, G. Balthasar, D. Hillerkuss, R. Schmogrow, M. Jordan, J. Leuthold, W. Freude, and C. Koos, Photonic wire bonding: a novel concept for chip-scale interconnects, Opt.

A4.7 (C. Koos/ N. Lindenmann) [A4.7:1] * N. Lindenmann, G. Balthasar, D. Hillerkuss, R. Schmogrow, M. Jordan, J. Leuthold, W. Freude, and C. Koos, Photonic wire bonding: a novel concept for chip-scale interconnects, Opt.

DocID: 1obss - View Document

micronanofabricacion_centro_tecnologia_nanofotonica

micronanofabricacion_centro_tecnologia_nanofotonica

DocID: 1fEkh - View Document

Design and Measurement of Matched Wire Bond and Flip Chip Interconnects for D-Band System-in-Package Applications S. Beer, B. Ripka, S. Diebold, H. Gulan, C. Rusch, P. Pahl, T. Zwick Institut fuer Hochfrequenztechnik und

Design and Measurement of Matched Wire Bond and Flip Chip Interconnects for D-Band System-in-Package Applications S. Beer, B. Ripka, S. Diebold, H. Gulan, C. Rusch, P. Pahl, T. Zwick Institut fuer Hochfrequenztechnik und

DocID: 1a4g1 - View Document